Invention Grant
- Patent Title: System and method for measuring void fraction of inside of heat conduction member
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Application No.: US17529269Application Date: 2021-11-18
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Publication No.: US11768166B2Publication Date: 2023-09-26
- Inventor: Chen-Li Sun , Yu-Hsiang Liu , Yu-Jen Lien
- Applicant: NATIONAL TAIWAN UNIVERSITY
- Applicant Address: TW Taipei
- Assignee: NATIONAL TAIWAN UNIVERSITY
- Current Assignee: NATIONAL TAIWAN UNIVERSITY
- Current Assignee Address: TW Taipei
- Agency: Li & Cai Intellectual Property Office
- Priority: TW 0108497 2021.03.10
- Main IPC: G01N27/22
- IPC: G01N27/22 ; G01K3/14 ; G01N33/00

Abstract:
A system and a method for measuring a void fraction of an inside of a heat conduction member are provided. The system is used to measure the heat conduction member and includes: a heating device configured as a heat source to heat an evaporation end of the heat conduction member; a cooling device configured for cooling a condensation end of the heat conduction member; at least one pair of electrode pads respectively attached to two opposite surfaces of the heat conduction member; and an LCR meter electrically connected to the at least one pair of the electrode pads for measuring impedances of the heat conduction member. Each of the impedances is converted into the void fraction that corresponds to a measured position of the heat conduction member.
Public/Granted literature
- US20220291161A1 SYSTEM AND METHOD FOR MEASURING VOID FRACTION OF INSIDE OF HEAT CONDUCTION MEMBER Public/Granted day:2022-09-15
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