Invention Grant
- Patent Title: Method and apparatus for microscopy imaging with resolution correction
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Application No.: US17010875Application Date: 2020-09-03
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Publication No.: US11768363B2Publication Date: 2023-09-26
- Inventor: Jiong Ma , Baoju Wang , Longfang Yao
- Applicant: FUDAN UNIVERSITY
- Applicant Address: CN Shanghai
- Assignee: FUDAN UNIVERSITY
- Current Assignee: FUDAN UNIVERSITY
- Current Assignee Address: CN Shanghai
- Agency: Ware, Fressola, Maguire & Barber LLP
- Priority: CN 1910830344.8 2019.09.04
- Main IPC: G02B21/36
- IPC: G02B21/36 ; G02B21/00 ; G06T3/40

Abstract:
A method and apparatus for microscopic imaging is provided. The method includes: illuminating the sample with illumination radiation to stimulate the detection radiation; capturing the detection radiation from the sample; with the intensity data of the detection radiation from the sample; applying the calibration algorithm to the captured image(s) to acquire the processed second image; the resolution of the processed second image is higher than the acquired first image.
Public/Granted literature
- US20210063720A1 Method and apparatus for microscopy imaging Public/Granted day:2021-03-04
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