Invention Grant
- Patent Title: Semiconductor device including a through silicon via structure and method of fabricating the same
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Application No.: US17219336Application Date: 2021-03-31
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Publication No.: US11769711B2Publication Date: 2023-09-26
- Inventor: Jung Yong Chae , Jin Hee Cho
- Applicant: SK hynix Inc.
- Applicant Address: KR Icheon-si
- Assignee: SK HYNIX INC.
- Current Assignee: SK HYNIX INC.
- Current Assignee Address: KR Icheon-si
- Agency: Perkins Coie LLP
- Priority: KR 20200179951 2020.12.21
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L21/768 ; H01L23/522

Abstract:
A semiconductor device may include a via hole, a first electrode, a second electrode and a first protecting insulation layer. The via hole may be formed to penetrate a substrate. The first electrode may include an electrode segment formed on a surface of the via hole. The second electrode may be formed on the first electrode along the surface of the via hole. The second electrode may include two ends that are positioned below a surface of the substrate. The first protecting insulation layer may be formed on the second electrode along the surface of the via hole. The first protecting insulation layer may include both ends that upwardly protrude from the both ends of the second electrode.
Public/Granted literature
- US20220199493A1 SEMICONDUCTOR DEVICE INCLUDING A THROUGH SILICON VIA STRUCTURE AND METHOD OF FABRICATING THE SAME Public/Granted day:2022-06-23
Information query
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