Invention Grant
- Patent Title: Semiconductor device and methods of forming the same
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Application No.: US17213200Application Date: 2021-03-25
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Publication No.: US11769716B2Publication Date: 2023-09-26
- Inventor: Yung-Sheng Lin , Cheng-Lung Yang , Chin-Yu Ku , Ming-Da Cheng , Wen-Hsiung Lu , Tang-Wei Huang , Fu Wei Liu
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: JCIPRNET
- Main IPC: H01L23/495
- IPC: H01L23/495 ; H01L23/48 ; H01L21/768 ; H01L21/48 ; H01L23/00

Abstract:
A semiconductor device and method of forming the same are provided. The semiconductor device includes at least one substrate and an interconnection structure. The at least one substrate has a cavity partially defined by an inner sidewall of the at least one substrate and a channel disposed at a bottom of the at least one substrate. The channel laterally penetrates through the at least one substrate. The interconnections structure is disposed over the substrate, and the interconnection structure has a through hole penetrating through the interconnection structure. The through hole, the cavity and the channel are in spatial communication with each other.
Public/Granted literature
- US20220310492A1 SEMICONDUCTOR DEVICE AND METHODS OF FORMING THE SAME Public/Granted day:2022-09-29
Information query
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