Embodiments of the present disclosure generally relate to apparatus and methods for semiconductor processing, more particularly, to a system and method for monitoring a rotation-lift assembly of a process chamber. The rotation-lift assembly outputs a torque feedback signal which is processed by a controller to determine if the rotation-lift assembly has a fault or is near failure. The controller determines torque data from the torque feedback signal, compares the torque data to preexisting torque data, and, based on the comparison, issue a notice of a state of the rotation-lift assembly.