Invention Grant
- Patent Title: Isolation circuit having test mechanism and test method thereof
-
Application No.: US17501069Application Date: 2021-10-14
-
Publication No.: US11774497B2Publication Date: 2023-10-03
- Inventor: Kuo-Kai Liu , Chih-Chieh Cheng , Pei-Ying Hsueh
- Applicant: REALTEK SEMICONDUCTOR CORPORATION
- Applicant Address: TW Hsinchu
- Assignee: REALTEK SEMICONDUCTOR CORPORATION
- Current Assignee: REALTEK SEMICONDUCTOR CORPORATION
- Current Assignee Address: TW Hsinchu
- Agency: WPAT, PC
- Priority: TW 9136174 2020.10.19
- Main IPC: G01R31/3185
- IPC: G01R31/3185 ; G01R31/28

Abstract:
The present invention discloses an isolation circuit having test mechanism. An isolation circuit component performs signal transmission when a signal that a control terminal receives has an enabling state and performs signal isolation when the signal has a disabling state. The test circuit includes a multiplexer and a control circuit. Under a shifting operation state in a test mode, the control circuit controls the multiplexer to select an operation input terminal to receive and output an isolation control signal having the enabling state to the control input terminal. Under a capturing operation state in the test mode, the control circuit controls the multiplexer to select a test input terminal to receive and output the test signal to the control input terminal. The control circuit further determines whether the isolation circuit performs signal transmission or signal isolation according to the signals at the data input terminal and the data output terminal.
Public/Granted literature
- US20220120812A1 Isolation circuit having test mechanism and test method thereof Public/Granted day:2022-04-21
Information query
IPC分类: