Invention Grant
- Patent Title: Apparatus for monitoring a focal state of microscope
-
Application No.: US16881260Application Date: 2020-05-22
-
Publication No.: US11774740B2Publication Date: 2023-10-03
- Inventor: Joachim Fischer , Matthias Henrich , Winfried Willemer
- Applicant: Abberior Instruments GmbH
- Applicant Address: DE Goettingen
- Assignee: ABBERIOR INSTRUMENTS GMBH
- Current Assignee: ABBERIOR INSTRUMENTS GMBH
- Current Assignee Address: DE Goettingen
- Agency: Thomas | Horstemeyer, LLP
- Priority: DE 2019113975.9 2019.05.24
- Main IPC: G02B21/00
- IPC: G02B21/00 ; G02B21/06 ; G02B21/36

Abstract:
An apparatus is provided for monitoring a focal state of a microscope having an object plane and a main imaging area. The apparatus has an auxiliary light source providing an auxiliary light beam and coupling the auxiliary light beam into the microscope in such a way that the coupled auxiliary light beam runs within a plane which is spanned outside of the main imaging area by a straight line running in the object plane and a normal to the object plane, and that the coupled auxiliary light beam is inclined at an angle to a normal to the object plane. A part of the coupled auxiliary light beam reflected by a reference boundary surface in the microscope impinges on a registration device in an area of incidence. The registration device registers position changes of the area of incidence on the registration device.
Public/Granted literature
- US20200371339A1 Apparatus for Monitoring a Focal State of Microscope Public/Granted day:2020-11-26
Information query