Inspection method, program, inspection device, and printing device
Abstract:
Provided are an inspection method, a program, an inspection device, and a printing device capable of realizing a uniform inspection in a defect inspection of a printed article using a special substrate. A method includes an imaging data acquisition step (S14) of acquiring imaging data (48) of a printed article using a special substrate, a non-printing region positional information acquisition step (S16) of acquiring information (44) for specifying a position of a non-printing region in the imaging data, the non-printing region corresponding to a substrate region of the printed article on which a pattern and a background of the pattern are not printed, an inspection step (S20) of specifying the non-printing region, analyzing the imaging data by applying a predetermined inspection rule (46), and performing an inspection of the printed article, and a notification step (S22) of performing a notification of an inspection result (50) and not performing a notification of an inspection result indicating that a defect is present in the substrate region of the printed article corresponding to the non-printing region.
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