- Patent Title: Inspection method, program, inspection device, and printing device
-
Application No.: US17371259Application Date: 2021-07-09
-
Publication No.: US11776107B2Publication Date: 2023-10-03
- Inventor: Masaki Seki
- Applicant: FUJIFILM Corporation
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP 19038681 2019.03.04
- Main IPC: H04N1/00
- IPC: H04N1/00 ; G06T7/00 ; G06T7/73 ; G06T7/90 ; G06K15/02

Abstract:
Provided are an inspection method, a program, an inspection device, and a printing device capable of realizing a uniform inspection in a defect inspection of a printed article using a special substrate. A method includes an imaging data acquisition step (S14) of acquiring imaging data (48) of a printed article using a special substrate, a non-printing region positional information acquisition step (S16) of acquiring information (44) for specifying a position of a non-printing region in the imaging data, the non-printing region corresponding to a substrate region of the printed article on which a pattern and a background of the pattern are not printed, an inspection step (S20) of specifying the non-printing region, analyzing the imaging data by applying a predetermined inspection rule (46), and performing an inspection of the printed article, and a notification step (S22) of performing a notification of an inspection result (50) and not performing a notification of an inspection result indicating that a defect is present in the substrate region of the printed article corresponding to the non-printing region.
Public/Granted literature
- US20210334953A1 INSPECTION METHOD, PROGRAM, INSPECTION DEVICE, AND PRINTING DEVICE Public/Granted day:2021-10-28
Information query