• Patent Title: Foreign matter detection device, foreign matter detection method, and program
  • Application No.: US17438561
    Application Date: 2019-03-28
  • Publication No.: US11776143B2
    Publication Date: 2023-10-03
  • Inventor: Zhenwei Wang
  • Applicant: NEC Corporation
  • Applicant Address: JP Tokyo
  • Assignee: NEC CORPORATION
  • Current Assignee: NEC CORPORATION
  • Current Assignee Address: JP Tokyo
  • Agency: Sughrue Mion, PLLC
  • International Application: PCT/JP2019/013550 2019.03.28
  • International Announcement: WO2020/194650A 2020.10.01
  • Date entered country: 2021-09-13
  • Main IPC: G06K9/00
  • IPC: G06K9/00 G06T7/50 G06V10/762
Foreign matter detection device, foreign matter detection method, and program
Abstract:
A measurement information acquisition unit acquires depth information indicating a depth in a detection range measured by a depth measurement device that measures the depth. An image acquisition unit acquires an image of the detection range captured by an imaging device that captures the image. A depth extraction unit extracts partial depth information in which a portion not being subject to a determination of being foreign matter or not is removed from the depth information, based on the acquired image. A foreign matter determination unit determines presence or absence of foreign matter in the detection range based on the partial depth information.
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