Invention Grant
- Patent Title: Foreign matter detection device, foreign matter detection method, and program
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Application No.: US17438561Application Date: 2019-03-28
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Publication No.: US11776143B2Publication Date: 2023-10-03
- Inventor: Zhenwei Wang
- Applicant: NEC Corporation
- Applicant Address: JP Tokyo
- Assignee: NEC CORPORATION
- Current Assignee: NEC CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- International Application: PCT/JP2019/013550 2019.03.28
- International Announcement: WO2020/194650A 2020.10.01
- Date entered country: 2021-09-13
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/50 ; G06V10/762

Abstract:
A measurement information acquisition unit acquires depth information indicating a depth in a detection range measured by a depth measurement device that measures the depth. An image acquisition unit acquires an image of the detection range captured by an imaging device that captures the image. A depth extraction unit extracts partial depth information in which a portion not being subject to a determination of being foreign matter or not is removed from the depth information, based on the acquired image. A foreign matter determination unit determines presence or absence of foreign matter in the detection range based on the partial depth information.
Public/Granted literature
- US20220148205A1 FOREIGN MATTER DETECTION DEVICE, FOREIGN MATTER DETECTION METHOD, AND PROGRAM Public/Granted day:2022-05-12
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