The present disclosure generally relates to improved lifetime of a data storage device utilizing an energy assist element. Rather than applying the same current to each energy assist element of a device, each energy assist element has a write current specific to the energy assist element. The unique applied current results in the corresponding energy assist elements having substantially the same temperature during operation. Obtaining substantially the same temperature during operation provides predictable and repeatable device performance and increases the lifetime of the entire data storage device as all energy assist elements should have substantially the same lifetime.