Invention Grant
- Patent Title: Systems and methods for precisely generalized and modular underlay/overlay service and experience assurance
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Application No.: US17168511Application Date: 2021-02-05
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Publication No.: US11777811B2Publication Date: 2023-10-03
- Inventor: Robert Kevin Tomkins , Shelley A. Bhalla , Emil Janulewicz
- Applicant: Ciena Corporation
- Applicant Address: US MD Hanover
- Assignee: Ciena Corporation
- Current Assignee: Ciena Corporation
- Current Assignee Address: US MD Hanover
- Agency: Baratta Law PLLC
- Agent Lawrence A. Baratta, Jr.
- Main IPC: H04L41/06
- IPC: H04L41/06 ; H04L41/0631 ; H04L43/062 ; H04L43/16 ; H04L43/04 ; H04L41/044 ; H04L41/0659 ; H04L41/16

Abstract:
Systems and methods include obtaining overlay telemetry data from a plurality of overlays, wherein each overlay is an application and there is a corresponding telemetry adaptor for each overlay; obtaining underlay telemetry data from one or more underlays, wherein each underlay includes physical infrastructure for supporting one or more of network, compute, and store functions for the plurality of overlays; analyzing the overlay telemetry data and the underlay telemetry data via a Key Performance Factor (KPF) model that correlates one or more of the plurality of overlays and the one or more underlays together; responsive to an anomaly or a threshold crossing based on the KPF model, performing a Root Cause Analysis (RCA) to identify a root cause of the anomaly or the threshold crossing; and mapping one or more actions with associated priorities to the root cause utilizing one or more remediation modules each associated with an overlay.
Public/Granted literature
Information query