Invention Grant
- Patent Title: Method for forming a semiconductor device with conductive cap layer over conductive plug
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Application No.: US17245727Application Date: 2021-04-30
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Publication No.: US11778812B2Publication Date: 2023-10-03
- Inventor: Hung-Chi Tsai
- Applicant: NANYA TECHNOLOGY CORPORATION
- Applicant Address: TW New Taipei
- Assignee: NANYA TECHNOLOGY CORPORATION
- Current Assignee: NANYA TECHNOLOGY CORPORATION
- Current Assignee Address: TW New Taipei
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- The original application number of the division: US16422608 2019.05.24
- Main IPC: H10B12/00
- IPC: H10B12/00

Abstract:
The present disclosure relates to a method for forming a semiconductor device with a conductive cap layer over a conductive plug. The method includes forming a first word line and a second word line over a semiconductor substrate, and forming a dielectric layer covering the first word line and the second word line. The method also includes forming a conductive plug between the first word line and the second word line, wherein the conductive plug is surrounded by the dielectric layer. The method further includes removing a portion of the dielectric layer to partially expose a sidewall surface of the conductive plug, and forming a conductive cap layer covering a top surface and the sidewall surface of the conductive plug. In addition, the method includes forming a bit line over the conductive plug, wherein the bit line is electrically connected to the conductive plug through the conductive cap layer.
Public/Granted literature
- US20210265362A1 METHOD FOR FORMING A SEMICONDUCTOR DEVICE WITH CONDUCTIVE CAP LAYER OVER CONDUCTIVE PLUG Public/Granted day:2021-08-26
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