Invention Grant
- Patent Title: Diagnostic device, diagnostic method and program
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Application No.: US17251209Application Date: 2018-06-18
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Publication No.: US11782395B2Publication Date: 2023-10-10
- Inventor: Takahiko Masuzaki , Osamu Nasu
- Applicant: Mitsubishi Electric Corporation
- Applicant Address: JP Tokyo
- Assignee: MITSUBISHI ELECTRIC CORPORATION
- Current Assignee: MITSUBISHI ELECTRIC CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: XSENSUS LLP
- International Application: PCT/JP2018/023102 2018.06.18
- International Announcement: WO2019/244203A 2019.12.26
- Date entered country: 2020-12-11
- Main IPC: G05B13/02
- IPC: G05B13/02 ; G06N20/00 ; G01M99/00 ; G06Q10/0639 ; G06Q50/04 ; G07C3/00

Abstract:
A diagnostic device (10) includes an acquirer (101) and a diagnoser (140). The acquirer (101) acquires a plurality of input signals including a target signal to be diagnosed for abnormality. The diagnoser (140) diagnoses, using a first index value relating to the target signal and a second index value relating to the plurality of input signals based on a correlation between the plurality of input signals, whether an abnormality occurs. The first index value indicates a degree of similarity of a waveform of the target signal to a predetermined reference waveform. The second index value is a value that is based on comparison between the target signal and a predetermined pattern and is calculated from values of the plurality of input signals.
Public/Granted literature
- US20210263483A1 DIAGNOSTIC DEVICE, DIAGNOSTIC METHOD AND PROGRAM Public/Granted day:2021-08-26
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