Invention Grant
- Patent Title: Method and system for optical yield measurement of a standing crop in a field
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Application No.: US17301317Application Date: 2021-03-31
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Publication No.: US11783576B2Publication Date: 2023-10-10
- Inventor: Noel W. Anderson , Gurmukh H. Advani , Benjamin M. Smith
- Applicant: Deere & Company
- Applicant Address: US IL Moline
- Assignee: Deere & Company
- Current Assignee: Deere & Company
- Current Assignee Address: US IL Moline
- Main IPC: G06V20/10
- IPC: G06V20/10 ; G06T7/168 ; G06T7/13 ; G06T7/90 ; G06Q10/04 ; G06Q50/02 ; G06T7/00 ; G06V10/44 ; A01B79/00 ; A01D41/127 ; G06V10/75 ; G06V10/56

Abstract:
An electronic data processor is configured to identify the component pixels of a harvestable plant component within the obtained image data of plant pixels of the one or more target plants. An edge, boundary or outline of the component pixels is determined. The data processor is configured to detect a size of the harvestable plant component based on the determined edge, boundary or outline of the identified component pixels. A user interface is configured to provide an aggregate, sectional yield, or per row yield based on a detected size of the harvestable plant component for the one or more target plants as an indicator of yield of the one or more plants or standing crop in the field.
Public/Granted literature
- US20220138987A1 METHOD AND SYSTEM FOR OPTICAL YIELD MEASUREMENT OF A STANDING CROP IN A FIELD Public/Granted day:2022-05-05
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