Invention Grant
- Patent Title: Semiconductor device and method for fabricating the same
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Application No.: US17482081Application Date: 2021-09-22
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Publication No.: US11784051B2Publication Date: 2023-10-10
- Inventor: Young-Gwang Yoon , Yun-Ik Son , Jee-Hyun Park
- Applicant: SK hynix Inc.
- Applicant Address: KR Gyeonggi-do
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T GROUP LLP
- Priority: KR 20190026972 2019.03.08
- Main IPC: H01L29/49
- IPC: H01L29/49 ; H01L21/28 ; H01L21/3215

Abstract:
A method for fabricating a semiconductor device may include: forming a gate dielectric material over a substrate; sequentially forming a carbon-undoped polysilicon layer and a carbon-doped polysilicon layer over the gate dielectric material; doping the carbon-doped polysilicon layer with a dopant; forming a columnar crystalline polysilicon layer over the carbon-doped polysilicon layer doped with the dopant; and performing annealing to activate the dopant.
Public/Granted literature
- US20220013363A1 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME Public/Granted day:2022-01-13
Information query
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