Invention Grant
- Patent Title: Semiconductor structure and method of manufacturing the same
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Application No.: US17305837Application Date: 2021-07-15
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Publication No.: US11785861B2Publication Date: 2023-10-10
- Inventor: Fu-Ting Sung , Chung-Chiang Min , Yuan-Tai Tseng , Chern-Yow Hsu , Shih-Chang Liu
- Applicant: Taiwan Semiconductor Manufacturing Company Ltd.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee Address: TW Hsinchu
- Agency: HAYNES AND BOONE, LLP
- The original application number of the division: US15151207 2016.05.10
- Main IPC: H10N50/80
- IPC: H10N50/80 ; H01L27/105 ; H01L29/40 ; H10B61/00 ; H10N50/01 ; H10N50/10

Abstract:
The present disclosure provides a semiconductor structure, including an Nth metal layer, a bottom electrode over the Nth metal layer, a magnetic tunneling junction (MTJ) over the bottom electrode, a top electrode over the MTJ, and an (N+M)th metal layer over the Nth metal layer. N and M are positive integers. The (N+M)th metal layer surrounds a portion of a sidewall of the top electrode. A manufacturing method of forming the semiconductor structure is also provided.
Public/Granted literature
- US20210343932A1 SEMICONDUCTOR STRUCTURE AND METHOD OF MANUFACTURING THE SAME Public/Granted day:2021-11-04
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