Invention Grant
- Patent Title: Method and apparatus for sample labeling, and method and apparatus for identifying damage classification
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Application No.: US17141607Application Date: 2021-01-05
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Publication No.: US11790632B2Publication Date: 2023-10-17
- Inventor: Juan Xu
- Applicant: Advanced New Technologies Co., Ltd.
- Applicant Address: KY Grand Cayman
- Assignee: Advanced New Technologies Co., Ltd.
- Current Assignee: Advanced New Technologies Co., Ltd.
- Current Assignee Address: KY George Town
- Agency: Seed IP Law Group LLP
- Priority: CN 1810975325.X 2018.08.24
- Main IPC: G06V10/46
- IPC: G06V10/46 ; G06T7/11 ; G06F18/214 ; G06F18/2413 ; G06V10/10 ; G06V10/762 ; G06V10/764 ; G06V10/778 ; G06V20/10

Abstract:
An embodiment provides a system and method for sample labeling. During operation, the system obtains a plurality of historical loss assessment images and obtains a plurality of candidate samples from the plurality of loss assessment images. A respective candidate sample comprises an image of a candidate damage area detected in a corresponding historical loss assessment image. The system clusters the plurality of candidate samples into a plurality of class clusters. For a respective class cluster, the system determines a center candidate sample set corresponding to a class cluster center of the respective class cluster, receives a manual labeling result associated with candidate samples in the determined center candidate sample set, and performs, according to the manual labeling result, damage classification labeling on other unlabeled candidate samples in the respective class cluster to obtain a plurality of labeled samples.
Public/Granted literature
- US20210124967A1 METHOD AND APPARATUS FOR SAMPLE LABELING, AND METHOD AND APPARATUS FOR IDENTIFYING DAMAGE CLASSIFICATION Public/Granted day:2021-04-29
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