Invention Grant
- Patent Title: Semiconductor laser device manufacturing method and semiconductor laser device
-
Application No.: US17252840Application Date: 2018-08-20
-
Publication No.: US11791610B2Publication Date: 2023-10-17
- Inventor: Hitoshi Sakuma
- Applicant: Mitsubishi Electric Corporation
- Applicant Address: JP Tokyo
- Assignee: Mitsubishi Electric Corporation
- Current Assignee: Mitsubishi Electric Corporation
- Current Assignee Address: JP Tokyo
- Agency: Studebaker & Brackett PC
- International Application: PCT/JP2018/030657 2018.08.20
- International Announcement: WO2020/039475A 2020.02.27
- Date entered country: 2020-12-16
- Main IPC: H01S5/227
- IPC: H01S5/227 ; H01S5/042 ; H01S5/02

Abstract:
The present invention is characterized by comprising: forming a stacked structure in which a lower cladding layer, an active layer and an upper cladding layer are stacked on an InP substrate in a shape having a mesa stripe structure; forming a first insulation film on the stacked structure by a sputtering method; forming a second insulation film thinner than the first insulation film, on the first insulation film by a plasma CVD method at a film forming temperature higher than that when the first insulation film has been formed; and forming a first electrode on the upper cladding layer, and forming a second electrode on a back surface of the InP substrate.
Public/Granted literature
- US20210126433A1 SEMICONDUCTOR LASER DEVICE MANUFACTURING METHOD AND SEMICONDUCTOR LASER DEVICE Public/Granted day:2021-04-29
Information query