Invention Grant
- Patent Title: System and method for zeroth-order diagnostic in spectral beam combining system
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Application No.: US17066320Application Date: 2020-10-08
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Publication No.: US11799260B2Publication Date: 2023-10-24
- Inventor: Leva E. Bukowski
- Applicant: Raytheon Company
- Applicant Address: US MA Waltham
- Assignee: Raytheon Company
- Current Assignee: Raytheon Company
- Current Assignee Address: US MA Waltham
- Main IPC: H01S3/00
- IPC: H01S3/00 ; G01J1/42 ; G02B17/02 ; G02B27/30 ; G02B27/42 ; H01S3/23 ; H01S3/067

Abstract:
An apparatus includes a diffractive grating configured to receive multiple output beams from an array of laser sources. The apparatus also includes one or more optical elements configured to receive, direct, and focus multiple zeroth-order light beams, where the zeroth-order light beams include portions of the output beams reflected off the diffractive grating. The apparatus further includes a detector configured to receive the zeroth-order light beams from at least one of the one or more optical elements and process the zeroth-order light beams to generate diagnostic information.
Public/Granted literature
- US20220115829A1 SYSTEM AND METHOD FOR ZEROTH-ORDER DIAGNOSTIC IN SPECTRAL BEAM COMBINING SYSTEM Public/Granted day:2022-04-14
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