Invention Grant
- Patent Title: Keypoint-based sampling for pose estimation
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Application No.: US17457408Application Date: 2021-12-02
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Publication No.: US11804040B2Publication Date: 2023-10-31
- Inventor: Shreyas Hampali , Vincent Lepetit , Clemens Arth
- Applicant: QUALCOMM Technologies, Inc.
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agency: Polsinelli/Qualcomm
- Main IPC: G06V20/20
- IPC: G06V20/20 ; G06T7/73 ; G06V40/10 ; G06T9/00 ; G06T7/80 ; G06T7/50 ; G06T19/00 ; G06V10/40 ; G06V10/82 ; G06K9/62 ; G06N3/04 ; G06F18/213 ; G06F18/2431

Abstract:
Systems and techniques are provided for determining one or more poses of one or more objects. For example, a process can include determining, using a machine learning system, a plurality of keypoints from an image. The plurality of keypoints are associated with at least one object in the image. The process can include determining a plurality of features from the machine learning system based on the plurality of keypoints. The process can include classifying the plurality of features into a plurality of joint types. The process can include determining pose parameters for the at least one object based on the plurality of joint types.
Public/Granted literature
- US20220301304A1 KEYPOINT-BASED SAMPLING FOR POSE ESTIMATION Public/Granted day:2022-09-22
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