Invention Grant
- Patent Title: FinFET structure with controlled air gaps
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Application No.: US17136385Application Date: 2020-12-29
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Publication No.: US11804402B2Publication Date: 2023-10-31
- Inventor: Wen-Che Tsai , Min-Yann Hsieh , Hua Feng Chen , Kuo-Hua Pan
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: HAYNES AND BOONE, LLP
- Main IPC: H01L21/76
- IPC: H01L21/76 ; H01L29/49 ; H01L29/76 ; H01L21/768 ; H01L21/8234 ; H01L23/532 ; H01L21/285 ; H01L21/311 ; H01L23/528 ; H01L23/485 ; H01L21/764 ; H01L29/417

Abstract:
The present disclosure provides an integrated circuit (IC) structure. The IC structure includes first and second fins formed on a semiconductor substrate and laterally separated from each other by an isolation feature, the isolation feature formed of a dielectric material that physically contacts the semiconductor substrate; and a contact feature between the first and second fins and extending into the isolation feature thereby defining an air gap vertically between the isolation feature and the contact feature, the dielectric material of the isolation feature extending from the semiconductor substrate to the contact feature.
Public/Granted literature
- US20210118723A1 FinFET Structure with Controlled Air Gaps Public/Granted day:2021-04-22
Information query
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