Invention Grant
- Patent Title: Methods and apparatus to measure formation features
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Application No.: US17660845Application Date: 2022-04-27
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Publication No.: US11808143B2Publication Date: 2023-11-07
- Inventor: Jean-Christophe Auchere , Hiroshi Hori , Adam Pedrycz , Bharat Narasimhan
- Applicant: Schlumberger Technology Corporation
- Applicant Address: US TX Sugar Land
- Assignee: SCHLUMBERGER TECHNOLOGY CORPORATION
- Current Assignee: SCHLUMBERGER TECHNOLOGY CORPORATION
- Current Assignee Address: US TX Sugar Land
- Agent Jeffrey D. Frantz
- Main IPC: E21B47/12
- IPC: E21B47/12 ; E21B44/02 ; E21B49/00

Abstract:
Methods, apparatus, systems, and articles of manufacture are disclosed to measure a formation feature. An example apparatus includes a pre-processor to compare a first measurement obtained from a first sensor included in a logging tool at a first depth at a first time and a second measurement obtained from a second sensor included in the logging tool at the first depth at a second time. The example apparatus also include a semblance calculator to: calculate a correction factor based on a difference between the first measurement and the second measurement; and calculate a third measurement based on the correction factor and a fourth measurement obtained from the first sensor at a second depth at the second time. The example apparatus also includes a report generator to generate a report including the third measurement.
Public/Granted literature
- US20220251946A1 METHODS AND APPARATUS TO MEASURE FORMATION FEATURES Public/Granted day:2022-08-11
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