An inspection device includes: an illumination device that irradiates an object with near-infrared light; a spectroscope that disperses reflected light from the object irradiated with the near-infrared light; an imaging device that takes a spectroscopic image of the reflected light dispersed by the spectroscope; and a processor. The processor obtains spectral data at a plurality of points on the object based on the spectroscopic image obtained by the imaging device, selects, from among the spectral data at the plurality of points, a group having a highest density of luminance values of a predetermined wavelength component as a dense spectral data group, and performs a predetermined analysis for the object based on the dense spectral data group and detects a different type of object.