Invention Grant
- Patent Title: X-ray analyzer and X-ray analysis method
-
Application No.: US17521404Application Date: 2021-11-08
-
Publication No.: US11808718B2Publication Date: 2023-11-07
- Inventor: Daisuke Harada , Yasuyuki Keyaki
- Applicant: Shimadzu Corporation
- Applicant Address: JP Kyoto
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto
- Agency: Maier & Maier, PLLC
- Priority: JP 21033776 2021.03.03
- Main IPC: G01N23/046
- IPC: G01N23/046

Abstract:
An X-ray analyzer has a configuration including an X-ray source, an X-ray detector configured to detect an X-ray irradiated from the X-ray source, a rotary stage (stage) disposed between the X-ray source and the X-ray detector, and configured to hold an imaging target, and a light irradiation mechanism configured to irradiate light coaxially with an X-ray optical axis of the X-ray irradiated from the X-ray source to project a shadow of the imaging target onto a position of the X-ray detector.
Public/Granted literature
- US20220283101A1 X-RAY ANALYZER AND X-RAY ANALYSIS METHOD Public/Granted day:2022-09-08
Information query