Invention Grant
- Patent Title: Method for detecting skidding of robot, mapping method and chip
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Application No.: US16645492Application Date: 2018-08-06
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Publication No.: US11832774B2Publication Date: 2023-12-05
- Inventor: Yongyong Li , Gangjun Xiao
- Applicant: AMICRO SEMICONDUCTOR CO., LTD.
- Applicant Address: CN Guangdong
- Assignee: AMICRO SEMICONDUCTOR CO., LTD.
- Current Assignee: AMICRO SEMICONDUCTOR CO., LTD.
- Current Assignee Address: CN Guangdong
- Agent Yu Gang
- Priority: CN 1710818702.4 2017.09.12
- International Application: PCT/CN2018/098914 2018.08.06
- International Announcement: WO2019/052285A 2019.03.21
- Date entered country: 2020-03-09
- Main IPC: A47L11/24
- IPC: A47L11/24 ; A47L9/00 ; A47L11/40 ; A47L9/28

Abstract:
The present disclosure relates to a method for detecting a skidding of a robot, a mapping method and a chip. A method for detecting a skidding of a robot, comprising the following steps: By an odometer on existing driving wheels of a robot and a gyroscope and a processor in a body of the robot, a first angle change rate generated by two driving wheels within a preset time and a second angle change rate generated by the gyroscope within the preset time are detected and calculated, so as to determine an angular velocity change error rate of the robot. Finally, by judging whether the angular velocity change error rate is greater than or equal to a preset value, it is determined whether the robot is in the skidding state.
Public/Granted literature
- US20200275816A1 Method for Detecting Skidding of Robot, Mapping Method and Chip Public/Granted day:2020-09-03
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