Invention Grant
- Patent Title: All-digital phase-locked loop and calibration method thereof
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Application No.: US17869784Application Date: 2022-07-20
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Publication No.: US11838027B2Publication Date: 2023-12-05
- Inventor: Yu-Che Yang
- Applicant: Realtek Semiconductor Corp.
- Applicant Address: TW HsinChu
- Assignee: Realtek Semiconductor Corp.
- Current Assignee: Realtek Semiconductor Corp.
- Current Assignee Address: TW HsinChu
- Agent Winston Hsu
- Priority: TW 0127373 2021.07.26
- Main IPC: H03L7/099
- IPC: H03L7/099 ; H03L7/085 ; H03L7/107

Abstract:
An all-digital phase-locked loop (ADPLL) and a calibration method thereof are provided. The ADPLL includes a digitally controlled oscillator (DCO), a time-to-digital converter (TDC) coupled to the DCO, and a normalization circuit coupled to the TDC. The TDC is configured to generate a clock signal according to a frequency control signal. The TDC is configured to generate a digital output signal according to a phase difference between the clock signal and a reference signal. The normalization circuit is configured to convert the digital output signal into a clock phase value according to a gain parameter. The normalization circuit selects one of a plurality of candidate gain parameters stored in the normalization circuit in response to the digital output signal, for being utilized as the gain parameter.
Public/Granted literature
- US20230028270A1 ALL-DIGITAL PHASE-LOCKED LOOP AND CALIBRATION METHOD THEREOF Public/Granted day:2023-01-26
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