Invention Grant
- Patent Title: Semiconductor structure having a thermal shunt below a metallization layer and integration schemes
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Application No.: US17156634Application Date: 2021-01-25
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Publication No.: US11842940B2Publication Date: 2023-12-12
- Inventor: Ramsey Hazbun , Siva P. Adusumilli , Mark David Levy , Alvin Joseph
- Applicant: GLOBALFOUNDRIES U.S. Inc.
- Applicant Address: US CA Santa Clara
- Assignee: GlobalFoundries U.S. Inc.
- Current Assignee: GlobalFoundries U.S. Inc.
- Current Assignee Address: US NY Malta
- Agent Anthony Canale
- Main IPC: H01L23/367
- IPC: H01L23/367 ; H01L21/48

Abstract:
A semiconductor structure is provided. The semiconductor structure comprises a heat generating device arranged over a substrate. An interlayer dielectric (ILD) material may be arranged over the heat generating device and the substrate. A metallization layer may be arranged over the interlayer dielectric material. A thermal shunt structure may be arranged proximal the heat generating device, whereby an upper portion of the thermal shunt structure may be arranged in the interlayer dielectric material and may be lower than the metallization layer, and a lower portion of the thermal shunt structure may be arranged in the substrate.
Public/Granted literature
- US20220238409A1 SEMICONDUCTOR STRUCTURE HAVING A THERMAL SHUNT BELOW A METALLIZATION LAYER AND INTEGRATION SCHEMES Public/Granted day:2022-07-28
Information query
IPC分类: