An integrated circuit is disclosed. The integrated circuit comprises: a processing region configured to run one instruction from a plurality of instructions; a first temperature measuring region configured to measure a first temperature within the integrated circuit in response to the processing region running the one instruction; the processing region being configured to compare the measured first temperature with a predefined temperature at the first temperature measuring region when the processing region runs the one instruction and to trigger an event when the measured first temperature exceeds the predefined temperature by a threshold value.