Invention Grant
- Patent Title: Beam measurement method and beam measurement device
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Application No.: US17784624Application Date: 2019-12-13
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Publication No.: US11843986B2Publication Date: 2023-12-12
- Inventor: Mingju Li
- Applicant: BEIJING XIAOMI MOBILE SOFTWARE CO., LTD.
- Applicant Address: CN Beijing
- Assignee: Beijing Xiaomi Mobile Software Co., Ltd.
- Current Assignee: Beijing Xiaomi Mobile Software Co., Ltd.
- Current Assignee Address: CN Beijing
- Agency: Arch & Lake LLP
- International Application: PCT/CN2019/125346 2019.12.13
- International Announcement: WO2021/114276A 2021.06.17
- Date entered country: 2022-06-10
- Main IPC: H04W24/10
- IPC: H04W24/10 ; H04W36/00 ; H04B17/309 ; H04B17/382 ; H04B7/06 ; H04L5/00
Abstract:
A beam measurement method is provided. A terminal obtains beam measurement result reporting configuration of a neighbor cell, and determines a reference signal configuration of beam measurement of the neighbor cell. The terminal performs the beam measurement on the reference signal of the neighbor cell based on the reference signal configuration of the beam measurement. The terminal reports a beam measurement result of the neighbor cell.
Public/Granted literature
- US20230009770A1 BEAM MEASUREMENT METHOD AND BEAM MEASUREMENT DEVICE Public/Granted day:2023-01-12
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