Invention Grant
- Patent Title: Analyzing storage systems using machine learning systems
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Application No.: US15971171Application Date: 2018-05-04
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Publication No.: US11847558B2Publication Date: 2023-12-19
- Inventor: Sorin Faibish , Philippe Armangau , James M. Pedone, Jr.
- Applicant: EMC IP HOLDING COMPANY LLC
- Applicant Address: US MA Hopkinton
- Assignee: EMC IP Holding Company LLC
- Current Assignee: EMC IP Holding Company LLC
- Current Assignee Address: US MA Hopkinton
- Agent Krishnendu Gupta; Lesley Leonessa
- Main IPC: G06N3/08
- IPC: G06N3/08 ; G06F3/06 ; G06N5/04 ; G06T7/13 ; G06N20/00 ; G06V10/82 ; G06N5/046

Abstract:
A method is used in analyzing a storage system using a machine learning system. Data gathered from information associated with operations performed in a storage system is analyzed. The storage system is comprised of a plurality of components. A bitmap image is created based on the gathered data, where at least one of the plurality of components is represented in the bitmap image. The machine learning system is trained using the bitmap image, where the bitmap image is organized to depict the plurality of components of the storage system.
Public/Granted literature
- US20190340459A1 ANALYZING STORAGE SYSTEMS USING MACHINE LEARNING SYSTEMS Public/Granted day:2019-11-07
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