Invention Grant
- Patent Title: Magnetic resonance measurement apparatus
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Application No.: US17275605Application Date: 2019-09-10
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Publication No.: US11852702B2Publication Date: 2023-12-26
- Inventor: Masato Takahashi
- Applicant: RIKEN
- Applicant Address: JP Wako
- Assignee: RIKEN
- Current Assignee: RIKEN
- Current Assignee Address: JP Wako
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP 18171745 2018.09.13
- International Application: PCT/JP2019/035446 2019.09.10
- International Announcement: WO2020/054686A 2020.03.19
- Date entered country: 2021-03-11
- Main IPC: G01R33/36
- IPC: G01R33/36 ; G01R33/34

Abstract:
A magnetic resonance measurement apparatus according to the present invention includes a first LC circuit that forms an oscillating magnetic field that causes an object to exhibit magnetic resonance. The first LC circuit includes a parallel connection assembly including a diode. The parallel connection assembly further includes a diode connected, in parallel and in reverse direction, to the diode, or an inductor connected in parallel to the diode. In a first state in which oscillating voltage for forming the oscillating magnetic field is applied to the first LC circuit, the diode of the parallel connection assembly functions as a short-circuit such that the resonance frequency of the first LC circuit becomes a first resonance frequency. In a second state in which oscillating voltage is not applied to the first LC circuit, the diode of the parallel connection assembly functions as capacitance such that the resonance frequency of the first LC circuit becomes a second resonance frequency that is different from the first resonance frequency.
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