Invention Grant
- Patent Title: Methods and apparatus for data analysis
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Application No.: US15991324Application Date: 2018-05-29
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Publication No.: US11853899B2Publication Date: 2023-12-26
- Inventor: Deana Delp
- Applicant: In-Depth Test LLC
- Applicant Address: US TX Plano
- Assignee: In-Depth Test LLC
- Current Assignee: In-Depth Test LLC
- Current Assignee Address: US TX Plano
- Agency: Noblitt & Newson, PLLC
- Main IPC: G06N3/08
- IPC: G06N3/08 ; G06N3/088 ; G05B23/02 ; G06F11/22 ; G06F11/263 ; G06F11/273 ; H01L21/66 ; G06N3/045 ; G01R31/28 ; G06N3/126
Abstract:
A method and apparatus for data analysis according to various aspects of the present invention is configured to test a set of components and generate test data for the components. A diagnostic system automatically analyzes the test data to identify a characteristic of a component fabrication process by recognizing a pattern in the test data and classifying the pattern using a neural network.
Public/Granted literature
- US20180293500A1 METHODS AND APPARATUS FOR DATA ANALYSIS Public/Granted day:2018-10-11
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