- Patent Title: Film stress control for plasma enhanced chemical vapor deposition
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Application No.: US17328509Application Date: 2021-05-24
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Publication No.: US11854771B2Publication Date: 2023-12-26
- Inventor: Chien-Teh Kao , Tae Kyung Won , Carl A. Sorensen , Sanjay D. Yadav , Young Dong Lee , Shinichi Kurita , Soo Young Choi
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: APPLIED MATERIALS, INC.
- Current Assignee: APPLIED MATERIALS, INC.
- Current Assignee Address: US CA Santa Clara
- Agency: PATTERSON & SHERIDAN, LLP
- Main IPC: H01J37/32
- IPC: H01J37/32 ; H01L21/683 ; C23C16/455 ; C23C16/52 ; H01L21/02

Abstract:
Embodiments of the present disclosure include methods and apparatus for depositing a plurality of layers on a large area substrate. In one embodiment, a processing chamber for plasma deposition is provided. The processing chamber includes a showerhead and a substrate support assembly. The showerhead is coupled to an RF power source and a ground and includes a plurality of perforated gas diffusion members. A plurality of plasma applicators is disposed within the showerhead, wherein one plasma applicator of the plurality of plasma applicators corresponds to one of the plurality of perforated gas diffusion members. Further, a DC bias power source is coupled to a substrate support assembly.
Public/Granted literature
- US20210280392A1 FILM STRESS CONTROL FOR PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION Public/Granted day:2021-09-09
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