Invention Grant
- Patent Title: Semiconductor structure and method for forming the same
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Application No.: US18061990Application Date: 2022-12-05
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Publication No.: US11854867B2Publication Date: 2023-12-26
- Inventor: Jen-Yuan Chang
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee Address: TW Hsinchu
- Agency: WPAT LAW
- Agent Anthony King
- The original application number of the division: US17085327 2020.10.30
- Main IPC: H01L21/768
- IPC: H01L21/768 ; H01L21/306 ; H01L21/56 ; H01L23/00

Abstract:
A method for forming a semiconductor structure includes receiving a first die having a first interconnect structure and a first bonding layer over the first interconnect structure, and a second die having a second interconnect structure and a second bonding layer over the second interconnect structure; forming a recess indenting into the first bonding layer; and forming a positioning member on the second bonding layer. The method further includes bonding the second die over the first die; and disposing the positioning member into the recess. The positioning member includes dielectric, is surrounded by the first bonding layer, and is isolated from the first interconnect structure and the second interconnect structure.
Public/Granted literature
- US20230098026A1 SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME Public/Granted day:2023-03-30
Information query
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