Invention Grant
- Patent Title: Method of manufacturing semiconductor structure
-
Application No.: US17696591Application Date: 2022-03-16
-
Publication No.: US11855042B2Publication Date: 2023-12-26
- Inventor: Ming-Fa Chen , Wen-Chih Chiou , Sung-Feng Yeh
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee Address: TW Hsinchu
- Agency: WPAT LAW
- Agent Anthony King
- Main IPC: H01L25/065
- IPC: H01L25/065 ; H01L23/31 ; H01L23/48 ; H01L23/00 ; H01L25/00 ; H01L21/56 ; H01L23/538 ; H01L25/10

Abstract:
A method of manufacturing a semiconductor structure includes following operations. A substrate is provided. A first die is disposed over the substrate. A second die is provided. The second die includes a via extended within the second die. The second die is disposed over the substrate. A molding is formed around the first die and second die. An interconnect structure is formed. The interconnect structure includes a dielectric layer and a conductive member. The dielectric layer is disposed over the molding, the first die and the second die. The conductive member is surrounded by the dielectric layer. The via is formed by removing a portion of the second die to form a recess extended within the second die and disposing a conductive material into the recess.
Public/Granted literature
- US20220208725A1 METHOD OF MANUFACTURING SEMICONDUCTOR STRUCTURE Public/Granted day:2022-06-30
Information query
IPC分类: