Invention Grant
- Patent Title: Metal-insulator-semiconductor tunnel diode memory
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Application No.: US17582674Application Date: 2022-01-24
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Publication No.: US11855099B2Publication Date: 2023-12-26
- Inventor: Jenn-Gwo Hwu , Ting-Hao Hsu
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. , NATIONAL TAIWAN UNIVERSITY
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.,NATIONAL TAIWAN UNIVERSITY
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.,NATIONAL TAIWAN UNIVERSITY
- Current Assignee Address: TW Hsinchu; TW Taipei
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Main IPC: H01L29/88
- IPC: H01L29/88 ; H01L27/105 ; G11C11/38 ; H01L27/102 ; H01L29/66 ; H10B99/00

Abstract:
A method includes forming a first dielectric layer over the substrate and covering first, second, third, fourth, fifth and sixth protrusion regions; forming first, second, and third gate conductors over the first, fourth, and fifth protrusion regions, respectively; performing a first implantation process to form a second source region and a second drain region in the fourth protrusion region; performing a second implantation process to form a first source region and a first drain region in the first protrusion region, and to form a third source region and a third drain region in the fifth protrusion region; forming a metal layer over the third protrusion region; patterning the metal layer to form an inner circular electrode and an outer ring electrode encircling the inner circular electrode; forming a word line; and forming a bit line.
Public/Granted literature
- US20230238384A1 MEMORY DEVICE AND METHOD FOR FORMING THE SAME Public/Granted day:2023-07-27
Information query
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