- Patent Title: Method for leak testing and reference leak device for leak testing
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Application No.: US17556042Application Date: 2021-12-20
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Publication No.: US11860065B2Publication Date: 2024-01-02
- Inventor: Mao Hirata , Tsutomu Hara , Naoto Izumo , Masaharu Sugihara
- Applicant: FUKUDA CO., LTD.
- Applicant Address: JP Tokyo
- Assignee: FUKUDA CO., LTD.
- Current Assignee: FUKUDA CO., LTD.
- Current Assignee Address: JP Tokyo
- Agency: Harter Secrest & Emery LLP
- Agent Jodi A. Reynolds, Esq.
- Priority: JP 16108114 2016.05.31
- The original application number of the division: US16301906
- Main IPC: G01M3/32
- IPC: G01M3/32 ; G01M3/26 ; G01M3/02 ; G01M3/00

Abstract:
A method for leak testing includes a leak testing step and a reference leak step. In the leak testing step, a hollow work 20 as a test object is encapsulated in a work capsule 11. A test pressure is supplied to the work capsule 11 through a path 2a connected to the work capsule. A variation of pressure inside the work capsule 11 is detected in a condition in which the path 2a is shut-off, and a judgment is made whether a leakage through the work is generated based on the detected output. In the reference leak step, a reference leak device 30 having a known pinhole 31a is mounted on a work 20′ for reference leakage that is same as the work 20 as the test object. The work 20′ for reference leakage is encapsulated in the work capsule 11. The test pressure is supplied to the work capsule 11 via the path 2a, and a reference leakage is generated in the work 20′ for reference leakage via the reference leak device 30 in a condition in which the path 2a is shut-off. A variation of pressure inside the work capsule 11 accompanying the reference leakage is detected.
Public/Granted literature
- US20220113218A1 METHOD FOR LEAK TESTING AND REFERENCE LEAK DEVICE FOR LEAK TESTING Public/Granted day:2022-04-14
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