Invention Grant
- Patent Title: Article inspection apparatus using spectrum analyzer
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Application No.: US17814034Application Date: 2022-07-21
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Publication No.: US11860110B2Publication Date: 2024-01-02
- Inventor: Shigeo Arai , Eiji Taniguchi , Takashi Suzuki
- Applicant: ANRITSU CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: ANRITSU CORPORATION
- Current Assignee: ANRITSU CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Pearne & Gordon, LLP
- Priority: JP 21123075 2021.07.28
- Main IPC: G01N21/95
- IPC: G01N21/95 ; G01N21/84 ; G01N21/88

Abstract:
To provide an article inspection apparatus capable of sensitively and stably detecting a change in a spectrum when an unspecified foreign substance is contained and determining a defective product. A transport unit that transports a tablet for inspection to an article inspection position, a light irradiation unit that irradiates the tablet transported to the article inspection position with light, a light detection unit that detects light transmitted through the tablet, and an article inspection unit that inspects a quality of the tablet based on spectral characteristics of the light detected by the light detection unit are provided, and the article inspection unit standardizes a measured value of a spectrum of the light detected by the light detection unit for each wavelength and determines whether the tablet is a normal product or a defective product based on a standardized value.
Public/Granted literature
- US20230035626A1 ARTICLE INSPECTION APPARATUS Public/Granted day:2023-02-02
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