Invention Grant
- Patent Title: Deterioration detection device
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Application No.: US17750317Application Date: 2022-05-21
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Publication No.: US11862277B2Publication Date: 2024-01-02
- Inventor: Youngduk Lee , Hyunsung Lim
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Muir Patent Law, PLLC
- Priority: KR 20210117792 2021.09.03
- Main IPC: G11C29/50
- IPC: G11C29/50

Abstract:
A deterioration detection device includes a storage including a first current path and a second current path and configured such that a current is applied to the first current path and the second current path, a storage input control unit configured to compare an internal operating condition of a memory device with a target condition in a first operating mode and to select one of the first current path and the second current path of the storage based on a result of the comparison, and an output unit configured to output an output signal indicated deterioration, accumulated in one of the first current path and the second current path, in a second operating mode.
Public/Granted literature
- US20230071135A1 DETERIORATION DETECTION DEVICE Public/Granted day:2023-03-09
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