Invention Grant
- Patent Title: Semiconductor device and manufacturing method thereof
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Application No.: US16865024Application Date: 2020-05-01
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Publication No.: US11862555B2Publication Date: 2024-01-02
- Inventor: Jae Yoon Noh , Tae Kyung Kim , Hyo Sub Yeom , Jeong Yun Lee
- Applicant: SK hynix Inc.
- Applicant Address: KR Icheon-si
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Icheon-si
- Agency: William Park & Associates Ltd.
- Priority: KR 20190118206 2019.09.25
- Main IPC: H10B41/27
- IPC: H10B41/27 ; H01L23/522 ; H01L23/528 ; H10B41/35 ; H10B41/41 ; H10B43/27 ; H10B43/35 ; H10B43/40 ; H10B63/00

Abstract:
There are provided a semiconductor device and a manufacturing method thereof. The semiconductor device includes: a stack structure including a plurality of interlayer insulating layers and a plurality of gate conductive layers, which are stacked in an alternating manner; at least one support structure penetrating the stack structure in a substantially vertical manner, the at least one support structure being formed in a contact region; and a contact plug penetrating the stack structure in a substantially vertical manner, the contact plug being formed in the contact region, the contact plug being connected to a contact pad that is disposed on the bottom of the stack structure. The at least one support structure is formed of an oxide layer.
Public/Granted literature
- US11901284B2 Semiconductor device and manufacturing method thereof Public/Granted day:2024-02-13
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