Invention Grant
- Patent Title: Apparatus and method for measuring low load current
-
Application No.: US17569075Application Date: 2022-01-05
-
Publication No.: US11863056B2Publication Date: 2024-01-02
- Inventor: Min Sang Park , Dongjin Keum , Byoungmook Kim
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR 20210025965 2021.02.25
- Main IPC: H02M3/158
- IPC: H02M3/158 ; H02M1/00 ; H02M3/157

Abstract:
An apparatus configured to measure a load current provided to a load of a switching converter includes a pulse generation circuit configured to generate a control pulse based on a power switch driving signal of the switching converter, a reference current generation circuit configured to generate a reference current based on the control pulse, a clock generation circuit configured to generate a clock signal based on the control pulse and the reference current, and a clock counter configured to count the number of cycles of the clock signal during a switching period of the switching converter. The reference current generation circuit is configured to adjust the reference current to compensate for a leakage current generated in the clock generation circuit during the switching period.
Public/Granted literature
- US20220271660A1 APPARATUS AND METHOD FOR MEASURING LOW LOAD CURRENT Public/Granted day:2022-08-25
Information query
IPC分类: