Invention Grant
- Patent Title: Learning method for the detection of anomalies implemented on a microcontroller and associated method for detecting anomalies
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Application No.: US17660548Application Date: 2022-04-25
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Publication No.: US11868197B2Publication Date: 2024-01-09
- Inventor: Francois De Rochebouet , He Huang
- Applicant: Cartesiam
- Applicant Address: FR Toulon
- Assignee: STMicroelectronics International N.V.
- Current Assignee: STMicroelectronics International N.V.
- Current Assignee Address: CH Geneva
- Agency: Slater Matsil, LLP
- Priority: FR 05293 2019.05.21
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/07 ; G06F9/50 ; G06F11/30 ; G06F11/32 ; G06F18/22
Abstract:
A learning method detects anomalies and is implemented on a microcontroller including at least one memory, the microcontroller being configured to receive data sets coming from at least one sensor, the memory being configured to store a maximum number of categories, a category including at least a signature and an occurrence.
Public/Granted literature
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