Invention Grant
- Patent Title: Granular error reporting on multi-pass programming of non-volatile memory
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Application No.: US17946328Application Date: 2022-09-16
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Publication No.: US11868202B2Publication Date: 2024-01-09
- Inventor: Qisong Lin , Vamsi Pavan Rayaprolu , Jiangang Wu , Sampath K. Ratnam , Sivagnanam Parthasarathy , Shao Chun Shi
- Applicant: MICRON TECHNOLOGY, INC.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Lowenstein Sandler LLP
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/07

Abstract:
A system includes a memory component to, upon completion of second pass programming in response to a multi-pass programming command, write a plurality of flag bits within a group of memory cells programmed by the multi-pass programming command. The system also includes a processing device, operatively coupled to the memory component. The processing device is to detect an error in attempting to read a top page of the group of memory cells, determine a number of first values within the plurality of flag bits, and in response to the number of first values not satisfying a threshold criterion, report, to a host computing device, an uncorrectable data error due to the top page of the group of memory cells being incompletely programmed.
Public/Granted literature
- US20230012978A1 GRANULAR ERROR REPORTING ON MULTI-PASS PROGRAMMING OF NON-VOLATILE MEMORY Public/Granted day:2023-01-19
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