Invention Grant
- Patent Title: Generating metrics values at component levels of a monolithic application and of a microservice of a microservices-based architecture
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Application No.: US17698851Application Date: 2022-03-18
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Publication No.: US11868234B1Publication Date: 2024-01-09
- Inventor: Mayank Agarwal , Steven Karis , Justin Smith
- Applicant: SPLUNK INC.
- Applicant Address: US CA San Francisco
- Assignee: SPLUNK Inc.
- Current Assignee: SPLUNK Inc.
- Current Assignee Address: US CA San Francisco
- Agency: Kilpatrick Townsend & Stockton LLP
- Main IPC: G06F11/36
- IPC: G06F11/36

Abstract:
Monitoring and troubleshooting tools provide the capability to visualize different levels of a client's application that is deployed as a suite of independent but cooperating services (e.g., an application that includes a monolithic application and a microservices-based application), collect values of monitored or tracked metrics at those different levels, and visualize values of the metrics at those levels. For example, metrics values can be generated for components of the monolithic application and/or for components of a microservice of the microservice-based application.
Information query