A semiconductor device (100) includes: a determination unit (110) configured to determine whether an avoidance condition of inspection of control flow integrity is satisfied (e.g., a degree of similarity with a previous input value is in a predetermined range) based on determination auxiliary information, which is at least an input value in a target code block to be executed among a plurality of code blocks in a predetermined program, and an inspection unit (120) configured to avoid inspection of control flow integrity in the target code block when it is determined that the avoidance condition is satisfied.