Invention Grant
- Patent Title: Abnormal part display apparatus, abnormal part display system, abnormal part display method, and abnormal part display program
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Application No.: US17193136Application Date: 2021-03-05
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Publication No.: US11869179B2Publication Date: 2024-01-09
- Inventor: Shigeo Suzuki , Taisuke Tanabe , Hiroshi Matsumoto , Takanori Shigeta , Junichi Abe , Akira Tsuji , Yoshimasa Ono , Jiro Abe
- Applicant: NEC Corporation
- Applicant Address: JP Tokyo
- Assignee: NEC CORPORATION
- Current Assignee: NEC CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP 20041198 2020.03.10
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G01S17/86 ; G01S17/42

Abstract:
An abnormal part display apparatus, an abnormal part display system, an abnormal part displaying method, and an abnormal part displaying program capable of improving visibility of an abnormal part in an object are provided. An abnormal part display apparatus 11 according to the present disclosure includes an acquisition unit 111 configured to acquire point group data of an object obtained by measuring the object by using a laser ranging apparatus 12, and a photograph image of the object obtained by photographing the object by using a photographing apparatus 13, a display unit 112 configured to display the point group data and the photograph image on a predetermined screen, and a control unit 113 configured to control the point group data and the photograph image to be displayed in the display unit 112.
Public/Granted literature
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