Invention Grant
- Patent Title: Memory device having low write error rate
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Application No.: US17563619Application Date: 2021-12-28
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Publication No.: US11869575B2Publication Date: 2024-01-09
- Inventor: Sang-Hoon Jung
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Muir Patent Law, PLLC
- Priority: KR 20190045314 2019.04.18
- The original application number of the division: US16691127 2019.11.21
- Main IPC: G11C11/40
- IPC: G11C11/40 ; G11C11/408 ; G11C11/409 ; G11C7/22 ; G11C7/10

Abstract:
A memory device includes a cell array including cells, an address transition detector outputting a transition detection signal as to whether an address of a write command is changed, and a control logic circuit generating one of word-line-on signals for performing a write operation on the cell array in response to the write command, and terminating the write operation in accordance with the transition detection signal. The word-line-on signals include a long-kept word-line-on signal that stays active before the address is changed and a divided word-line-on signal that is, before the address is changed, divided into sub-word-line-on signals.
Public/Granted literature
- US20220122649A1 MEMORY DEVICE Public/Granted day:2022-04-21
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