Invention Grant
- Patent Title: Selectable fuse sets, and related methods, devices, and systems
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Application No.: US17647508Application Date: 2022-01-10
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Publication No.: US11869620B2Publication Date: 2024-01-09
- Inventor: Christopher G. Wieduwilt , James S. Rehmeyer , Seth A. Eichmeyer
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: TraskBritt
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C11/408

Abstract:
Memory devices are disclosed. A device may include a number of memory banks and a number of latch sets, wherein each latch set is associated with a memory bank. The device may also include a fuse array including a number of fuses. The device may further include circuitry configured to read data from a first set of fuses of the number of fuses and broadcast data from the first set of fuses to a first latch set of the number of latch sets. Further, in response to a repair result associated with the first set of fuses being a first state, the circuitry may be configured to read a second set of fuses and broadcast the second set of fuses to the first latch set. Methods of operating a memory device, microelectronic devices, semiconductor devices, and electronic systems are also disclosed.
Public/Granted literature
- US20220139492A1 SELECTABLE FUSE SETS, AND RELATED METHODS, DEVICES, AND SYSTEMS Public/Granted day:2022-05-05
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