Invention Grant
- Patent Title: IC having a metal ring thereon for stress reduction
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Application No.: US17810568Application Date: 2022-07-01
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Publication No.: US11869820B2Publication Date: 2024-01-09
- Inventor: Amit Sureshkumar Nangia , Sreenivasan Kalyani Koduri , Siva Prakash Gurrum , Christopher Daniel Manack
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Ronald O. Neerings; Frank D. Cimino
- The original application number of the division: US16859530 2020.04.27
- Main IPC: H01L23/00
- IPC: H01L23/00 ; H01L23/16

Abstract:
An integrated circuit (IC) includes a substrate including circuitry configured for a function, the circuitry including at least one stress sensitive circuit portion, with at least a portion of nodes in the circuitry electrically coupled to bond pads provided by a top metal layer. A metal wall that is ring-shaped is positioned above the top metal layer that is not electrically coupled to the circuitry. The stress sensitive circuit portion is with at least a majority of its area within an inner area of the substrate that is framed by the metal wall to provide a cavity.
Public/Granted literature
- US20220336304A1 IC HAVING A METAL RING THEREON FOR STRESS REDUCTION Public/Granted day:2022-10-20
Information query
IPC分类: