Invention Grant
- Patent Title: Three-dimensional capacitor-inductor based on high functional density through silicon via structure and preparation method thereof
-
Application No.: US17052847Application Date: 2020-07-02
-
Publication No.: US11869827B2Publication Date: 2024-01-09
- Inventor: Wei Zhang , Ziyu Liu , Lin Chen , Qingqing Sun
- Applicant: FUDAN UNIVERSITY , SHANGHAI INTEGRATED CIRCUIT MANUFACTURING INNOVATION CENTER CO., LTD
- Applicant Address: CN Shanghai
- Assignee: Shanghai Integrated Circuit Manufacturing Innovation Center Co., Ltd.
- Current Assignee: Shanghai Integrated Circuit Manufacturing Innovation Center Co., Ltd.
- Current Assignee Address: CN Shanghai
- Agency: Thomas E. Lees, LLC
- Priority: CN 2010561660.2 2020.06.18
- International Application: PCT/CN2020/099976 2020.07.02
- International Announcement: WO2021/253512A 2021.12.23
- Date entered country: 2021-03-23
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L21/768 ; H01L27/01 ; H01L23/522 ; H01L23/00

Abstract:
The invention pertains to the technical field of semiconductor devices, and specifically relates to a three-dimensional capacitor-inductor based on a high-functional-density through silicon via structure and a manufacturing method, The three-dimensional capacitor-inductor of the present invention includes: a substrate formed with a through silicon via; a three-dimensional capacitor, formed on a sidewall of the through silicon via, and sequentially including a first metal layer, a second insulating layer; and a second metal layer; and a three-dimensional inductor, composed of center-filled metal of the through silicon via and planar thick metal rewiring, wherein a first insulating layer is provided between the sidewall of the through silicon via and the three-dimensional capacitor, and a third insulating layer is provided between the three-dimensional capacitor and the three-dimensional inductor, The invention can effectively increase the values of capacitance and inductance in an integrated system, and at the same time can integrate capacitors and inductors near the chip in three-dimensional integration, and can also improve the functional density of through silicon via in three-dimensional integration and increase the utilization rate of silicon in system integration. Compared with discrete capacitors and inductors on other organic substrates, the integration can be greatly improved.
Public/Granted literature
Information query
IPC分类: